Study on the characteristics of metal-organic interface for organic thin-film transistors
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, J | - |
dc.contributor.author | Choi, JS | - |
dc.date.accessioned | 2022-02-17T03:41:02Z | - |
dc.date.available | 2022-02-17T03:41:02Z | - |
dc.date.created | 2022-02-17 | - |
dc.date.issued | 2005-12-15 | - |
dc.identifier.issn | 0379-6779 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/25127 | - |
dc.description.abstract | In this study, the interfacial characteristics between pentacene and Au layers were investigated with varying of the deposition rate of Au layer from 1.0 to 15.0 angstrom/s. For the devices with the structure of bottorn-Au/pentacene/top-Au, it was observed that the electrical characteristics could be improved by increasing the deposition rate of top-Au, and the highest electrical conductivity value, 1.5 x 10(-6) S/cm, was obtained for the device with the top-Au-deposited at 15.0 angstrom/s. AES results showed that the integrated atomic content of Au in top-Au layer is substantially increased with the deposition rate of top-Au, but there was no critical difference in the depth profile of An atoms regardless of the deposition rate of top-Au. And also, we fabricated pentacene-based Schottky diodes and measured the hole injection barrier heights from Au electrode into pentacene layer using Fowler-Nordheim theory. Upon the investigations, it was observed that the hole injection barrier was reduced with increasing the deposition rate of Au electrode and the lowest value of 0.12 eV was obtained for the device with the Au electrode deposited at 15.0 angstrom/s. As a result, the performance of top-contact OTFT could be improved with increasing the deposition rate of Au electrodes (source and drain). (C) 2005 Elsevier B.V. All rights reserved. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | ELSEVIER SCIENCE SA | - |
dc.subject | CONTACT RESISTANCE | - |
dc.title | Study on the characteristics of metal-organic interface for organic thin-film transistors | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Choi, JS | - |
dc.identifier.doi | 10.1016/j.synthmet.2005.08.023 | - |
dc.identifier.scopusid | 2-s2.0-28844464430 | - |
dc.identifier.wosid | 000234185700039 | - |
dc.identifier.bibliographicCitation | SYNTHETIC METALS, v.155, no.3, pp.657 - 661 | - |
dc.relation.isPartOf | SYNTHETIC METALS | - |
dc.citation.title | SYNTHETIC METALS | - |
dc.citation.volume | 155 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 657 | - |
dc.citation.endPage | 661 | - |
dc.type.rims | ART | - |
dc.type.docType | Article; Proceedings Paper | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalResearchArea | Polymer Science | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.relation.journalWebOfScienceCategory | Polymer Science | - |
dc.subject.keywordPlus | CONTACT RESISTANCE | - |
dc.subject.keywordAuthor | pentacene | - |
dc.subject.keywordAuthor | organic TFTs | - |
dc.subject.keywordAuthor | Fowler-Nordheim theory | - |
dc.subject.keywordAuthor | metal-organic interface | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
94, Wausan-ro, Mapo-gu, Seoul, 04066, Korea02-320-1314
COPYRIGHT 2020 HONGIK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.