ScholarWorks@Hongik

Detailed Information

Cited 0 time in webofscience Cited 0 time in scopus
Metadata Downloads

The hole blocking effect of 4,4 ',4 ''-trifluoro-triazine (tfTZ) in electroluminescent devices

Full metadata record
DC Field Value Language
dc.contributor.authorShin, J-
dc.contributor.authorLim, S-
dc.contributor.authorShin, DM-
dc.contributor.authorChoi, D-
dc.contributor.authorKim, C-
dc.contributor.authorKim, B-
dc.date.accessioned2022-04-12T06:43:34Z-
dc.date.available2022-04-12T06:43:34Z-
dc.date.created2022-04-12-
dc.date.issued2001-
dc.identifier.issn1542-1406-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/27306-
dc.description.abstractThe hole blocking characteristics of 4,4',4 " -trifluoro-triazine (tfTZ) were studied. The current density vs. voltage characteristics and the electroluminescence spectra of elelctroluminescent(EL) devices, which were fabricated with the structure of ITO/tfTZ/hole transport layer/emitting layer were measured. In this letter, we investigated the electrical and optical effects accompanied by the thickness change of tfTZ layer. In EL devices including tfTZ layer, current density and turn-on voltage decreased in comparison with those without tfTZ layer.-
dc.language영어-
dc.language.isoen-
dc.publisherTAYLOR & FRANCIS LTD-
dc.subjectTHIN-FILMS-
dc.titleThe hole blocking effect of 4,4 ',4 ''-trifluoro-triazine (tfTZ) in electroluminescent devices-
dc.typeArticle-
dc.contributor.affiliatedAuthorShin, DM-
dc.identifier.doi10.1080/10587250108024776-
dc.identifier.wosid000172816400105-
dc.identifier.bibliographicCitationMOLECULAR CRYSTALS AND LIQUID CRYSTALS, v.371, pp.431 - 434-
dc.relation.isPartOfMOLECULAR CRYSTALS AND LIQUID CRYSTALS-
dc.citation.titleMOLECULAR CRYSTALS AND LIQUID CRYSTALS-
dc.citation.volume371-
dc.citation.startPage431-
dc.citation.endPage434-
dc.type.rimsART-
dc.type.docTypeArticle; Proceedings Paper-
dc.description.journalClass1-
dc.description.journalRegisteredClassscie-
dc.relation.journalResearchAreaChemistry-
dc.relation.journalResearchAreaCrystallography-
dc.relation.journalResearchAreaMaterials Science-
dc.relation.journalWebOfScienceCategoryChemistry, Multidisciplinary-
dc.relation.journalWebOfScienceCategoryCrystallography-
dc.relation.journalWebOfScienceCategoryMaterials Science, Multidisciplinary-
dc.subject.keywordPlusTHIN-FILMS-
dc.subject.keywordAuthorhole blocking layer-
dc.subject.keywordAuthorcurrent density-
dc.subject.keywordAuthorturn-on voltage-
Files in This Item
There are no files associated with this item.
Appears in
Collections
College of Engineering > Chemical Engineering Major > 1. Journal Articles
Show simple item record

qrcode

Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.

Altmetrics

Total Views & Downloads

STATISTICS
Total View :2,527,628
Today View :1,541

RSS_1.0 RSS_2.0 ATOM_1.0

CONTACT US

94, Wausan-ro, Mapo-gu, Seoul, 04066, Korea02-320-1314

COPYRIGHT 2020 HONGIK UNIVERSITY. ALL RIGHTS RESERVED.

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

BROWSE

한국어