Characterization of alpha-sexithienyl thin films deposited by OMBD (Organic Molecular Beam Deposition) technique
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, YI | - |
dc.contributor.author | Kwon, OK | - |
dc.contributor.author | Choi, JS | - |
dc.contributor.author | Kim, YK | - |
dc.contributor.author | Shin, DM | - |
dc.contributor.author | Kang, DY | - |
dc.date.accessioned | 2022-05-18T06:42:21Z | - |
dc.date.available | 2022-05-18T06:42:21Z | - |
dc.date.created | 2022-05-18 | - |
dc.date.issued | 1997 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/27666 | - |
dc.description.abstract | alpha-sexithiethyl(alpha-6T) thin films of the were deposited by Organic Molecular Beam Deposition(OMBD) technique The alpha-6T was synthesized and purified by the sublimation method. The thin films of the alpha-6T were deposited under various deposition conditions. The effects of deposition rate, substrate temperature, and vacuum pressure on the formation of these films have been studied. The molecular orientations of alpha-6T films were investigated with the polarized electronic absorption spectroscopy. The molecules in the alpha-6T film deposited at a low deposition rate under a high vacuum were aligned almost perpendicular to the substrate. The film deposited at an elevated substrate temperature (similar to-90 degrees C) showed higher conductivity than the film deposited at room temperature. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | I E E E | - |
dc.title | Characterization of alpha-sexithienyl thin films deposited by OMBD (Organic Molecular Beam Deposition) technique | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Choi, JS | - |
dc.contributor.affiliatedAuthor | Kim, YK | - |
dc.contributor.affiliatedAuthor | Shin, DM | - |
dc.contributor.affiliatedAuthor | Kang, DY | - |
dc.identifier.wosid | A1997BJ48U00152 | - |
dc.identifier.bibliographicCitation | PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2, pp.617 - 619 | - |
dc.relation.isPartOf | PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2 | - |
dc.citation.title | PROCEEDINGS OF THE 5TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 AND 2 | - |
dc.citation.startPage | 617 | - |
dc.citation.endPage | 619 | - |
dc.type.rims | ART | - |
dc.type.docType | Proceedings Paper | - |
dc.description.journalClass | 3 | - |
dc.relation.journalResearchArea | Engineering | - |
dc.relation.journalResearchArea | Materials Science | - |
dc.relation.journalWebOfScienceCategory | Engineering, Electrical & Electronic | - |
dc.relation.journalWebOfScienceCategory | Materials Science, Multidisciplinary | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
94, Wausan-ro, Mapo-gu, Seoul, 04066, Korea02-320-1314
COPYRIGHT 2020 HONGIK UNIVERSITY. ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.