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Effects of impurities on the crystallization and grain growth of polycrystalline Si films
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Paik, JC | - |
| dc.contributor.author | Park, KH | - |
| dc.contributor.author | Choi, W | - |
| dc.contributor.author | Nam, SE | - |
| dc.contributor.author | Kim, HJ | - |
| dc.date.accessioned | 2022-05-18T06:43:09Z | - |
| dc.date.available | 2022-05-18T06:43:09Z | - |
| dc.date.created | 2022-05-18 | - |
| dc.date.issued | 1996 | - |
| dc.identifier.issn | 0272-9172 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/27705 | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.publisher | MATERIALS RESEARCH SOCIETY | - |
| dc.title | Effects of impurities on the crystallization and grain growth of polycrystalline Si films | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Nam, SE | - |
| dc.contributor.affiliatedAuthor | Kim, HJ | - |
| dc.identifier.wosid | A1996BG51T00059 | - |
| dc.identifier.bibliographicCitation | POLYCRYSTALLINE THIN FILMS: STRUCTURE, TEXTURE, PROPERTIES, AND APPLICATIONS II, v.403, pp.385 - 390 | - |
| dc.relation.isPartOf | POLYCRYSTALLINE THIN FILMS: STRUCTURE, TEXTURE, PROPERTIES, AND APPLICATIONS II | - |
| dc.citation.title | POLYCRYSTALLINE THIN FILMS: STRUCTURE, TEXTURE, PROPERTIES, AND APPLICATIONS II | - |
| dc.citation.volume | 403 | - |
| dc.citation.startPage | 385 | - |
| dc.citation.endPage | 390 | - |
| dc.type.rims | ART | - |
| dc.type.docType | Proceedings Paper | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scie | - |
| dc.relation.journalResearchArea | Materials Science | - |
| dc.relation.journalWebOfScienceCategory | Materials Science, Coatings & Films | - |
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