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Refining an Assessing Model for Simplified TMM

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dc.contributor.authorPark, Bo Kyung-
dc.contributor.authorMoon, So Young-
dc.contributor.authorDu Kim, Ki-
dc.contributor.authorJang, Woo Sung-
dc.contributor.authorKim, R. Young Chul-
dc.contributor.authorCarlson, C. R.-
dc.date.accessioned2022-06-14T01:40:22Z-
dc.date.available2022-06-14T01:40:22Z-
dc.date.created2022-06-14-
dc.date.issued2016-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/28191-
dc.description.abstractCertification models, e.g. CMMI and TMMi, are hard to use most small software development organizations in Korea. Moreover, some companies do not have their own teams in charge of testing. To solve this issue, we propose the assessment method of a simplified test maturity model for small SW development organizations in local environment and. For the proposed assessment method, we consider the environment surrounding the local software industry and development teams, and then determine how to establish the assessment method. Vie show the proposed assessment method to apply local SMEs for their conditions, and reduces cost and labor as well as shortens the time spent on assessment in contrast to the previous models.-
dc.language영어-
dc.language.isoen-
dc.publisherIEEE-
dc.titleRefining an Assessing Model for Simplified TMM-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, R. Young Chul-
dc.identifier.wosid000381789800048-
dc.identifier.bibliographicCitation2016 INTERNATIONAL CONFERENCE ON PLATFORM TECHNOLOGY AND SERVICE (PLATCON)-
dc.relation.isPartOf2016 INTERNATIONAL CONFERENCE ON PLATFORM TECHNOLOGY AND SERVICE (PLATCON)-
dc.citation.title2016 INTERNATIONAL CONFERENCE ON PLATFORM TECHNOLOGY AND SERVICE (PLATCON)-
dc.type.rimsART-
dc.type.docTypeProceedings Paper-
dc.description.journalClass3-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.subject.keywordAuthorAssessment Model-
dc.subject.keywordAuthorSimplified TMM-
dc.subject.keywordAuthorTest Maturity Model-
dc.subject.keywordAuthorCMMI-
dc.subject.keywordAuthorTMMi-
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