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Inverse Relationship between Exo-Electron Currents and Statistical Delay of AC PDPs

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dc.contributor.authorKuang, Yawei-
dc.contributor.authorChoi, Keun-Ho-
dc.contributor.authorKim, Yong-Seog-
dc.date.accessioned2022-06-29T07:40:47Z-
dc.date.available2022-06-29T07:40:47Z-
dc.date.created2022-06-29-
dc.date.issued2010-
dc.identifier.issn1883-2490-
dc.identifier.urihttps://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/29701-
dc.description.abstractA relationship between exo-electron current and statistical relationship was examined on AC PDP test panels with or without MgO nano-crystals sprayed on MgO layer. The results indicated that the statistical delay is inversely proportional to exo-electron currents, but its proportional constant varies significantly, depending on the presence of MgO nano-crystals.-
dc.language영어-
dc.language.isoen-
dc.publisherINST IMAGE INFORMATION & TELEVISION ENGINEERS-
dc.titleInverse Relationship between Exo-Electron Currents and Statistical Delay of AC PDPs-
dc.typeArticle-
dc.contributor.affiliatedAuthorKim, Yong-Seog-
dc.identifier.wosid000393718700262-
dc.identifier.bibliographicCitationIDW'10: PROCEEDINGS OF THE 17TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3, pp.961 - 962-
dc.relation.isPartOfIDW'10: PROCEEDINGS OF THE 17TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3-
dc.citation.titleIDW'10: PROCEEDINGS OF THE 17TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3-
dc.citation.startPage961-
dc.citation.endPage962-
dc.type.rimsART-
dc.type.docTypeProceedings Paper-
dc.description.journalClass1-
dc.relation.journalResearchAreaEngineering-
dc.relation.journalResearchAreaOptics-
dc.relation.journalWebOfScienceCategoryEngineering, Electrical & Electronic-
dc.relation.journalWebOfScienceCategoryOptics-
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