Gate dielectric integrity of all organic thin film transistor and annealing effect
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Hong, Sung Hun | - |
dc.contributor.author | Kang, Jong Mook | - |
dc.contributor.author | Lim, Towoo | - |
dc.contributor.author | Kim, Jae Hyeok | - |
dc.contributor.author | Choi, Jong Sun | - |
dc.contributor.author | Kim, Young Min | - |
dc.date.accessioned | 2022-07-05T08:43:27Z | - |
dc.date.available | 2022-07-05T08:43:27Z | - |
dc.date.created | 2022-07-05 | - |
dc.date.issued | 2007 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/29969 | - |
dc.description.abstract | A significant degradation in the organic gate dielectric integrity is reported when an organic thin film transistor (OTFT) is exposed to air. The OTFT with polystyrene (PS) gate dielectric shows an increased I-OFF when the device has been exposed to air for a few weeks. The increased I-OFF is found to be attributed to degraded PS insulator property. The poor integrity of the gate dielectric causes an excessive I-OFF of the OTFT. Interestingly, the gate leakage current can be suppressed after the device is subjected to a few I-V tests at elevated temperatures and then reasonable I-OFF can be recovered. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | EAST CHINA NORMAL UNIVERSITY | - |
dc.title | Gate dielectric integrity of all organic thin film transistor and annealing effect | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Choi, Jong Sun | - |
dc.identifier.wosid | 000248022601139 | - |
dc.identifier.bibliographicCitation | AD'07: PROCEEDINGS OF ASIA DISPLAY 2007, VOLS 1 AND 2, pp.1696 - 1699 | - |
dc.relation.isPartOf | AD'07: PROCEEDINGS OF ASIA DISPLAY 2007, VOLS 1 AND 2 | - |
dc.citation.title | AD'07: PROCEEDINGS OF ASIA DISPLAY 2007, VOLS 1 AND 2 | - |
dc.citation.startPage | 1696 | - |
dc.citation.endPage | 1699 | - |
dc.type.rims | ART | - |
dc.type.docType | Proceedings Paper | - |
dc.description.journalClass | 3 | - |
dc.relation.journalResearchArea | Optics | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Optics | - |
dc.relation.journalWebOfScienceCategory | Physics, Multidisciplinary | - |
dc.relation.journalWebOfScienceCategory | Physics, Condensed Matter | - |
dc.subject.keywordAuthor | OTFTs | - |
dc.subject.keywordAuthor | pentacene | - |
dc.subject.keywordAuthor | polymer dielectric | - |
dc.subject.keywordAuthor | polystyrene | - |
dc.subject.keywordAuthor | anneal | - |
dc.subject.keywordAuthor | gate leakage | - |
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