Threshold condition for micro-ring cavity lasers with waveguide self-aligned total internal reflectors

Abstract

In this paper, the lasing characteristics of waveguide micro-ring cavity devices utilizing self-aligned total internal reflectors were analyzed by using a finite-difference time domain (FDTD) method and a transfer-matrix method (TMM). The simulation algorithm utilized a 2D FDTD combined with effective index method to analyze the total internal reflectors fabricated by the self-aligned SiN masks for RIE and re-growth. The whole micro-ring cavity performance was analyzed by using a TMM incorporating the device parameters extracted from the FDTD analysis. The simulation results were compared with the experimental results, which showed a good agreement.