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A defect tolerance scheme for nanoscale crossbar memory
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 최윤화 | - |
| dc.date.available | 2020-07-10T05:22:39Z | - |
| dc.date.created | 2020-07-08 | - |
| dc.date.issued | 2017-01-24 | - |
| dc.identifier.issn | 0973-4562 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/hongik/handle/2020.sw.hongik/6173 | - |
| dc.language | 영어 | - |
| dc.language.iso | en | - |
| dc.language.iso | en | - |
| dc.publisher | RIP | - |
| dc.title | A defect tolerance scheme for nanoscale crossbar memory | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | 최윤화 | - |
| dc.identifier.bibliographicCitation | IJAER, v.13, no.1, pp.298 - 303 | - |
| dc.relation.isPartOf | IJAER | - |
| dc.citation.title | IJAER | - |
| dc.citation.volume | 13 | - |
| dc.citation.number | 1 | - |
| dc.citation.startPage | 298 | - |
| dc.citation.endPage | 303 | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 1 | - |
| dc.description.journalRegisteredClass | scopus | - |
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