IEEE Design and Test
Journal Title
- IEEE Design and Test
ISSN
- E 2168-2364 | P 2168-2356 | 2168-2356 | 2168-2364
Publisher
- IEEE Computer Society
- IEEE
Listed on(Coverage)
| JCR | 2013-2019 |
|---|---|
| SJR | 1999-2019 |
| CiteScore | 2014-2019 |
| SCIE | 2013-2021 |
| CC | 2016-2021 |
| SCOPUS | 2017-2020 |
Active
- Active
based on the information
- SCOPUS:2020-10
Country
- USA
Aime & Scopes
- IEEE Design & Test offers original works describing the models, methods, and tools used to design and test microelectronic systems from devices and circuits to complete systems-on-chip and embedded software. The magazine focuses on current and near-future practice, and includes tutorials, how-to articles, and real-world case studies. The magazine seeks to bring to its readers not only important technology advances but also technology leaders, their perspectives through its columns, interviews, and roundtable discussions. Topics include semiconductor IC design, semiconductor intellectual property blocks, design, verification and test technology, design for manufacturing and yield, embedded software and systems, low-power and energy-efficient design, electronic design automation tools, practical technology, and standards.