Nano-Resolution Connectomics Using Large-Volume Electron MicroscopyNano-Resolution Connectomics Using Large-Volume Electron Microscopy
- Other Titles
- Nano-Resolution Connectomics Using Large-Volume Electron Microscopy
- Authors
- 김규현; 김자원; 이계주
- Issue Date
- Dec-2016
- Publisher
- 한국현미경학회
- Keywords
- Synapse; Neuron; Circuit; Electron microscopy; Brain mapping
- Citation
- 한국현미경학회지, v.46, no.4, pp.171 - 175
- Journal Title
- 한국현미경학회지
- Volume
- 46
- Number
- 4
- Start Page
- 171
- End Page
- 175
- URI
- http://scholarworks.bwise.kr/kbri/handle/2023.sw.kbri/841
- ISSN
- 2287-5123
- Abstract
- A distinctive neuronal network in the brain is believed to make us unique individuals.
Electron microscopy is a valuable tool for examining ultrastructural characteristics of neurons, synapses, and subcellular organelles. A recent technological breakthrough in volume electron microscopy allows large-scale circuit reconstruction of the nervous system with unprecedented detail. Serial-section electron microscopy—previously the domain of specialists—became automated with the advent of innovative systems such as the focused ion beam and serial block-face scanning electron microscopes and the automated tape-collecting ultramicrotome. Further advances in microscopic design and instrumentation are also available, which allow the reconstruction of unprecedentedly large volumes of brain tissue at high speed. The recent introduction of correlative light and electron microscopy will help to identify specific neural circuits associated with behavioral characteristics and revolutionize our understanding of how the brain works.
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