Shaislamov, Ulugbek; Yang, Jun-Mo; Yoo, Jung Ho; Seo, Hyun-Sang; Park, Kyung-Jin; Choi, Chel-Jong; Hong, Tae-Eun; Yang, Beelyong
ArticleIssue Date2008CitationMICROELECTRONICS RELIABILITY, v.48, no.10, pp 1734 - 1736PublisherPERGAMON-ELSEVIER SCIENCE LTD