Detailed Information
Cited 0 time in 
Cited 0 time in 
Cited 0 time in
Metadata Downloads
X7R 630 V급 적층 세라믹 커패시터의 전기적 특성에 미치는 테스트 픽스처의 영향
Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Ogyun Seok | - |
| dc.date.available | 2021-02-23T05:40:09Z | - |
| dc.date.created | 2021-02-23 | - |
| dc.date.issued | 2020-12 | - |
| dc.identifier.issn | 1975-8359 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/18571 | - |
| dc.publisher | The Korean Institute of Electrical Engineers | - |
| dc.title | X7R 630 V급 적층 세라믹 커패시터의 전기적 특성에 미치는 테스트 픽스처의 영향 | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Ogyun Seok | - |
| dc.identifier.bibliographicCitation | The Transactions of the Korean Institute of Electrical Engineers, v.69, no.12, pp.1886 - 1889 | - |
| dc.relation.isPartOf | The Transactions of the Korean Institute of Electrical Engineers | - |
| dc.citation.title | The Transactions of the Korean Institute of Electrical Engineers | - |
| dc.citation.volume | 69 | - |
| dc.citation.number | 12 | - |
| dc.citation.startPage | 1886 | - |
| dc.citation.endPage | 1889 | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 1 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | scopus | - |
| dc.description.journalRegisteredClass | kci | - |
- Files in This Item
- There are no files associated with this item.
- Appears in
Collections - School of Electronic Engineering > 1. Journal Articles
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.