Heptagons in the Basal Plane of Graphene Nanoflakes Analyzed by Simulated X-ray Photoelectron Spectroscopy
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Jungpil | - |
dc.contributor.author | Han, Jang-Woo | - |
dc.contributor.author | Yamada, Yasuhiro | - |
dc.date.available | 2021-03-22T00:40:16Z | - |
dc.date.issued | 2021-01-26 | - |
dc.identifier.issn | 2470-1343 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/19015 | - |
dc.description.abstract | The performance of graphene-based electronic devices depends critically on the existence of topological defects such as heptagons. Identifying heptagons at the atomic scale is important to completely understand the electronic properties of these materials. In this study, we report an atomic-scale analysis of graphene nanoflakes with two to eight isolated or connected heptagons, using simulated C 1s X-ray photoelectron spectroscopy (XPS) to estimate the XPS profiles depending on the density and the position of the heptagons. The introduction of up to 24% of isolated heptagons shifted the peak position toward high binding energies (284.0 to 284.3 eV), whereas the introduction of up to 39% of connected heptagons shifted the calculated peak position toward low binding energies (284.0 to 283.5 eV). The presence of heptagons also influenced the full width at half-maximum (FWHM). The introduction of 24% of isolated heptagons increased the FWHMs from 1.25 to 1.50 eV. However, the introduction of connected heptagons did not increase the FIATHMs above 1.40 eV. The FWHMs increased to 1.40 eV for 19% of connected heptagons, but did not increase further as the percentage of connected heptagons increased to 39%. Based on the calculated results, the XPS profiles of graphene nanoflakes containing heptagons with different densities and positions can be obtained. Our precise identification of heptagons in graphene nanoflakes by XPS lays the groundwork for the analysis of graphene. | - |
dc.format.extent | 7 | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | AMER CHEMICAL SOC | - |
dc.title | Heptagons in the Basal Plane of Graphene Nanoflakes Analyzed by Simulated X-ray Photoelectron Spectroscopy | - |
dc.type | Article | - |
dc.publisher.location | 미국 | - |
dc.identifier.doi | 10.1021/acsomega.0c05717 | - |
dc.identifier.wosid | 000613926400062 | - |
dc.identifier.bibliographicCitation | ACS OMEGA, v.6, no.3, pp 2389 - 2395 | - |
dc.citation.title | ACS OMEGA | - |
dc.citation.volume | 6 | - |
dc.citation.number | 3 | - |
dc.citation.startPage | 2389 | - |
dc.citation.endPage | 2395 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Chemistry | - |
dc.relation.journalWebOfScienceCategory | Chemistry, Multidisciplinary | - |
dc.subject.keywordPlus | GRAPHITE OXIDE | - |
dc.subject.keywordPlus | SPECTRA | - |
dc.subject.keywordPlus | RECONSTRUCTION | - |
dc.subject.keywordPlus | NANORIBBONS | - |
dc.subject.keywordPlus | OXIDATION | - |
dc.subject.keywordPlus | SURFACES | - |
dc.subject.keywordPlus | ARMCHAIR | - |
dc.subject.keywordPlus | ORIGIN | - |
dc.subject.keywordPlus | ZIGZAG | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
350-27, Gumi-daero, Gumi-si, Gyeongsangbuk-do, Republic of Korea (39253)054-478-7170
COPYRIGHT 2020 Kumoh University All Rights Reserved.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.