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A study on the analysis of HBM and CDM electrostatic discharge phenomena in CMOS integrated circuits
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Song, Kwang-soup | - |
| dc.date.available | 2021-04-29T08:45:09Z | - |
| dc.date.created | 2020-10-23 | - |
| dc.date.issued | 2002-02 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/19287 | - |
| dc.title | A study on the analysis of HBM and CDM electrostatic discharge phenomena in CMOS integrated circuits | - |
| dc.title.alternative | A study on the analysis of HBM and CDM electrostatic discharge phenomena in CMOS integrated circuits | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | Song, Kwang-soup | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 3 | - |
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Collections - Department of Medical IT Convergence Engineering > 1. Journal Articles
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Related Researcher
- Song, Kwang Soup
- College of Engineering (Department of Medical IT Convergence Engineering)