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원자간력 현미경의 측정면적 확대에 관한 연구
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 고명준 | - |
| dc.contributor.author | V. Patrangenaru | - |
| dc.contributor.author | 홍성욱 | - |
| dc.date.accessioned | 2023-12-11T14:00:29Z | - |
| dc.date.available | 2023-12-11T14:00:29Z | - |
| dc.date.issued | 2006 | - |
| dc.identifier.issn | 1225-9071 | - |
| dc.identifier.issn | 2287-8769 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/23892 | - |
| dc.format.extent | 8 | - |
| dc.publisher | 한국정밀공학회 | - |
| dc.title | 원자간력 현미경의 측정면적 확대에 관한 연구 | - |
| dc.title.alternative | A Study on Measurement Range Extension for Atomic force Microscope | - |
| dc.type | Article | - |
| dc.publisher.location | 대한민국 | - |
| dc.identifier.bibliographicCitation | 한국정밀공학회지, v.23, no.4, pp 168 - 175 | - |
| dc.citation.title | 한국정밀공학회지 | - |
| dc.citation.volume | 23 | - |
| dc.citation.number | 4 | - |
| dc.citation.startPage | 168 | - |
| dc.citation.endPage | 175 | - |
| dc.identifier.kciid | ART001002622 | - |
| dc.description.isOpenAccess | N | - |
| dc.description.journalRegisteredClass | kci | - |
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