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다수 위치 측정에서 최소 기준에 의한 공정능력지수The Process Capability Index of Minimum Base on the Multiple Measuring Locations
- Other Titles
- The Process Capability Index of Minimum Base on the Multiple Measuring Locations
- Authors
- 이도경
- Issue Date
- 2011
- Publisher
- 한국산업경영시스템학회
- Keywords
- Multiple Measure Points; System Process Capability Index
- Citation
- 한국산업경영시스템학회지, v.34, no.4, pp.114 - 119
- Journal Title
- 한국산업경영시스템학회지
- Volume
- 34
- Number
- 4
- Start Page
- 114
- End Page
- 119
- ISSN
- 2005-0461
- Abstract
- Process capability indices (PCIs) have been widely used in manufacturing industries to provide a quantitative measure of process potential and performance. The previous studies have measured only one location on each part in the case of single variate. To calculate the reliable process capability, a couple of measuring locations on each part are required. In this paper, we propose a new system process capability index SC_pm(m) which is the minimum value of the location PCIs.
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Related Researcher
- LEE, DO KYUNG
- College of Engineering (Department of Industrial Engineering)