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Test Case Generation for Context Testing of Embedded Systems
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Kim, Tae-Hyong | - |
| dc.date.accessioned | 2024-02-27T16:01:20Z | - |
| dc.date.available | 2024-02-27T16:01:20Z | - |
| dc.date.issued | 2007-11 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/kumoh/handle/2020.sw.kumoh/28025 | - |
| dc.publisher | IJCSNJ | - |
| dc.title | Test Case Generation for Context Testing of Embedded Systems | - |
| dc.title.alternative | Test Case Generation for Context Testing of Embedded System | - |
| dc.type | Article | - |
| dc.identifier.bibliographicCitation | International Journal of Computer Sciences and Network Security, v.7, no.11 | - |
| dc.citation.title | International Journal of Computer Sciences and Network Security | - |
| dc.citation.volume | 7 | - |
| dc.citation.number | 11 | - |
| dc.description.isOpenAccess | N | - |
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