An inkjet vision measurement technique for high-frequency jetting
DC Field | Value | Language |
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dc.contributor.author | Kwon, Kye-Si | - |
dc.contributor.author | Jang, Min-Hyuck | - |
dc.contributor.author | Park, Ha Yeong | - |
dc.contributor.author | Ko, Hyun-Seok | - |
dc.date.accessioned | 2021-08-11T22:45:28Z | - |
dc.date.available | 2021-08-11T22:45:28Z | - |
dc.date.issued | 2014-06 | - |
dc.identifier.issn | 0034-6748 | - |
dc.identifier.issn | 1089-7623 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/sch/handle/2021.sw.sch/12148 | - |
dc.description.abstract | Inkjet technology has been used as manufacturing a tool for printed electronics. To increase the productivity, the jetting frequency needs to be increased. When using high-frequency jetting, the printed pattern quality could be non-uniform since the jetting performance characteristics including the jetting speed and droplet volume could vary significantly with increases in jet frequency. Therefore, high-frequency jetting behavior must be evaluated properly for improvement. However, it is difficult to measure high-frequency jetting behavior using previous vision analysis methods, because subsequent droplets are close or even merged. In this paper, we present vision measurement techniques to evaluate the drop formation of high-frequency jetting. The proposed method is based on tracking target droplets such that subsequent droplets can be excluded in the image analysis by focusing on the target droplet. Finally, a frequency sweeping method for jetting speed and droplet volume is presented to understand the overall jetting frequency effects on jetting performance. (C) 2014 AIP Publishing LLC. | - |
dc.language | 영어 | - |
dc.language.iso | ENG | - |
dc.publisher | American Institute of Physics | - |
dc.title | An inkjet vision measurement technique for high-frequency jetting | - |
dc.type | Article | - |
dc.publisher.location | 미국 | - |
dc.identifier.doi | 10.1063/1.4879824 | - |
dc.identifier.scopusid | 2-s2.0-84901925920 | - |
dc.identifier.wosid | 000339010500055 | - |
dc.identifier.bibliographicCitation | Review of Scientific Instruments, v.85, no.6 | - |
dc.citation.title | Review of Scientific Instruments | - |
dc.citation.volume | 85 | - |
dc.citation.number | 6 | - |
dc.type.docType | Article | - |
dc.description.isOpenAccess | N | - |
dc.description.journalRegisteredClass | sci | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Instruments & Instrumentation | - |
dc.relation.journalResearchArea | Physics | - |
dc.relation.journalWebOfScienceCategory | Instruments & Instrumentation | - |
dc.relation.journalWebOfScienceCategory | Physics, Applied | - |
dc.subject.keywordPlus | JET | - |
dc.subject.keywordAuthor | 공학 | - |
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