Kwon, Hyukmin; Mohaisen, Aziz; Woo, Jiyoung; Kim, Yongdae; Lee, Eunjo; Kim, Huy Kang
ArticleIssue Date2017CitationIEEE Transactions on Information Forensics and Security, v.12, no.3, pp 544 - 556PublisherInstitute of Electrical and Electronics Engineers