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TEL측정으로 연구한 정공이동층두께에 따른 Tris-Alq3 에서 전자 이동도
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| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | 채희백 | - |
| dc.date.accessioned | 2021-08-12T05:46:08Z | - |
| dc.date.available | 2021-08-12T05:46:08Z | - |
| dc.date.created | 2021-06-17 | - |
| dc.date.issued | 2011-03 | - |
| dc.identifier.uri | https://scholarworks.bwise.kr/sch/handle/2021.sw.sch/16646 | - |
| dc.publisher | 한국물리학회 | - |
| dc.title | TEL측정으로 연구한 정공이동층두께에 따른 Tris-Alq3 에서 전자 이동도 | - |
| dc.type | Article | - |
| dc.contributor.affiliatedAuthor | 채희백 | - |
| dc.identifier.bibliographicCitation | 새물리(학진등), v.16, no.2, pp.302 - 310 | - |
| dc.relation.isPartOf | 새물리(학진등) | - |
| dc.citation.title | 새물리(학진등) | - |
| dc.citation.volume | 16 | - |
| dc.citation.number | 2 | - |
| dc.citation.startPage | 302 | - |
| dc.citation.endPage | 310 | - |
| dc.type.rims | ART | - |
| dc.description.journalClass | 3 | - |
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