A Study on the Uniformity Improvement of Residual Layer of a Large Area Nanoimprint Lithography
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김국원 | - |
dc.contributor.author | Rafigul I. Noorani | - |
dc.contributor.author | 김남웅 | - |
dc.date.accessioned | 2021-08-12T07:26:52Z | - |
dc.date.available | 2021-08-12T07:26:52Z | - |
dc.date.created | 2021-06-17 | - |
dc.date.issued | 2010 | - |
dc.identifier.issn | 1738-2270 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/sch/handle/2021.sw.sch/18201 | - |
dc.description.abstract | Nanoimprint lithography (NIL) is one of the most versatile and promising technology for micro/nano-patterning due to its simplicity, high throughput and low cost. Recently, one of the major trends of NIL is large-area patterning. Especially, the research of the application of NIL to TFT-LCD field has been increasing. Technical difficulties to keep the uniformity of the residual layer, however, become severer as the imprinting area increases. In this paper we performed a numerical study for a large area NIL (the 2nd generation TFT-LCD glass substrate (370×470 mm)) by using finite element method. First, a simple model considering the surrounding wall was established in order to simulate effectively and reduce the computing time. Then, the volume of fluid (VOF) and grid deformation method were utilized to calculate the free surfaces of the resist flow based on an Eulerian grid system. From the simulation, the velocity fields and the imprinting pressure during the filling process in the NIL were analyzed, and the effect of the surrounding wall and the uniformity of residual layer were investigated. | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | 한국반도체디스플레이기술학회 | - |
dc.title | A Study on the Uniformity Improvement of Residual Layer of a Large Area Nanoimprint Lithography | - |
dc.title.alternative | A Study on the Uniformity Improvement of Residual Layer of a Large Area Nanoimprint Lithography | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | 김국원 | - |
dc.identifier.bibliographicCitation | 반도체디스플레이기술학회지, v.9, no.4, pp.19 - 23 | - |
dc.relation.isPartOf | 반도체디스플레이기술학회지 | - |
dc.citation.title | 반도체디스플레이기술학회지 | - |
dc.citation.volume | 9 | - |
dc.citation.number | 4 | - |
dc.citation.startPage | 19 | - |
dc.citation.endPage | 23 | - |
dc.type.rims | ART | - |
dc.identifier.kciid | ART001513448 | - |
dc.description.journalClass | 2 | - |
dc.description.journalRegisteredClass | kci | - |
dc.subject.keywordAuthor | Nanoimprint Lithography | - |
dc.subject.keywordAuthor | Large Area | - |
dc.subject.keywordAuthor | Residual Layer Uniformity | - |
Items in ScholarWorks are protected by copyright, with all rights reserved, unless otherwise indicated.
(31538) 22, Soonchunhyang-ro, Asan-si, Chungcheongnam-do, Republic of Korea+82-41-530-1114
COPYRIGHT 2021 by SOONCHUNHYANG UNIVERSITY ALL RIGHTS RESERVED.
Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.