Localization of Small Objectives from Scattering Parameter via Bistatic Measurement Configuration

Abstract

We develop a sampling-type algorithm for localizing a small object from scattering parameter data measured in a bistatic configuration. To this end, we design a sampling-type imaging function based on the integral equation formula for the scattering parameter. To clarify its applicability, we show that the imaging function can be expressed by the bistatic angle, antenna arrangement, and Bessel function of an integer order. This result reveals some properties of the imaging function and influence of the selection of the bistatic angle. Numerical experiments are carried out for single and multiple small and large objectives to illustrate the pros and cons of the developed algorithm.