Rabelo, M.[Rabelo, M.]; Park, H.[Park, H.]; Kim, Y.[Kim, Y.]; Cho, E.-C.[Cho, E.-C.]; Yi, J.[Yi, J.]
ArticleIssue Date2021CitationTransactions on Electrical and Electronic Materials, v.22, no.5, pp.575 - 583PublisherKorean Institute of Electrical and Electronic Material Engineers