Oh, H.[Oh, H.]; KYUNG, S. J.[KYUNG, SHIN JAE]; JIN, C. W.[JIN, CHOI WOO]; CHENYIFEI[CHENYIFEI]; HYEONGJIN, J.[HYEONGJIN, JEON]; CHAN, C. Y.[CHAN, CHOI YOUNG]; Koo, H.[Koo, H.]; Yang, Y.[Yang, Y.]
ArticleIssue Date2021CitationIEEE MTT-S International Microwave Symposium Digest, v.2021-June, pp.649 - 652PublisherInstitute of Electrical and Electronics Engineers Inc.