Sun, L.[Sun, L.]; Ma, C.[Ma, C.]; Chen, Y.[Chen, Y.]; Shim, H.J.[Shim, H.J.]; Wu, Z.[Wu, Z.]; Jeon, B.[Jeon, B.]
ArticleIssue Date2019CitationIEEE Journal of Selected Topics in Applied Earth Observations and Remote Sensing, v.12, no.6, pp.1905 - 1919PublisherInstitute of Electrical and Electronics Engineers