Duong, D.T.[Duong, D.T.]; Dinh, M.L.[Dinh, M.L.]; Jeon, B.[Jeon, B.]; Van, X.H.[Van, X.H.]
ArticleIssue Date2019CitationIEIE Transactions on Smart Processing and Computing, v.8, no.6, pp.431 - 441PublisherInstitute of Electronics and Information Engineers