Chen, Y.[Chen, Y.]; Choi, W.[Choi, W.]; Shin, J.[Shin, J.]; Jeon, H.[Jeon, H.]; Bae, S.[Bae, S.]; Choi, Y.C.[Choi, Y.C.]; Park, C.-S.[Park, C.-S.]; Lee, K.-Y.[Lee, K.-Y.]; Hwang, K.C.[Hwang, K.C.]; Yang, Y.[Yang, Y.]
ArticleIssue Date2023CitationIEEE Access, v.11, pp.11479 - 11488PublisherInstitute of Electrical and Electronics Engineers Inc.