Kim, S.[Kim, S.]; Yoo, J.[Yoo, J.]; Choi, H.[Choi, H.]; Seo, J.[Seo, J.]; Lee, S.[Lee, S.]; Won, S.[Won, S.]; Park, J.[Park, J.]; Heo, K.[Heo, K.]
ArticleIssue Date2021CitationIEEE Access, v.9, pp.146525 - 146532PublisherInstitute of Electrical and Electronics Engineers Inc.