Kumar, T.[Kumar, T.]; Park, J.[Park, J.]; Ali, M.S.[Ali, M.S.]; Shahab, Uddin A.F.M.[Shahab, Uddin A.F.M.]; Ko, J.H.[Ko, J.H.]; Bae, S.[Bae, S.]
ArticleIssue Date2021CitationIEEE Access, v.9, pp.167663 - 167673PublisherInstitute of Electrical and Electronics Engineers Inc.