Hejazi, A.[Hejazi, A.]; Oh, S.[Oh, S.]; Rehman, M.R.U.[Rehman, M.R.U.]; Rad, R.E.[Rad, R.E.]; Kim, S.[Kim, S.]; Lee, J.[Lee, J.]; Pu, Y.[Pu, Y.]; Hwang, K.C.[Hwang, K.C.]; Yang, Y.[Yang, Y.]; Lee, K.-Y.[Lee, K.-Y.]
ArticleIssue Date2020CitationIEEE Transactions on Instrumentation and Measurement, v.69, no.11, pp.9262 - 9271PublisherInstitute of Electrical and Electronics Engineers Inc.