Han, S.[Han, S.]; Dhungel, S.K.[Dhungel, S.K.]; Park, S.[Park, S.]; de, Assis Rabelo M.[de, Assis Rabelo M.]; Pham, D.P.[Pham, D.P.]; Kim, Y.[Kim, Y.]; Yi, J.[Yi, J.]
ArticleIssue Date2023CitationTransactions on Electrical and Electronic Materials, v.24, no.2, pp.132 - 139PublisherKorean Institute of Electrical and Electronic Material Engineers
