HYEON, P. J.[HYEON, PARK JE]; Tran, N.M.[Tran, N.M.]; Hwang, S.I.[Hwang, S.I.]; Kim, D.I.[Kim, D.I.]; Choi, K.W.[Choi, K.W.]
ArticleIssue Date2021CitationIEEE Access, v.9, pp.168520 - 168534PublisherInstitute of Electrical and Electronics Engineers Inc.