Oh, J.[Oh, J.]; Kim, J.[Kim, J.]; Lee, J.[Lee, J.]; KYO, J. E.[KYO, JUNG EUN]; Oh, D.[Oh, D.]; Min, J.[Min, J.]; IM, H.[IM, HWARIM]; Kim, Y.[Kim, Y.]
ArticleIssue Date2021CitationIEEE Electron Device Letters, v.42, no.10, pp.1496 - 1499PublisherInstitute of Electrical and Electronics Engineers Inc.