Park, J.[Park, J.]; Jo, W.[Jo, W.]; Jeon, E.[Jeon, E.]; Kim, S.[Kim, S.]; Lee, C.[Lee, C.]; Lee, J.[Lee, J.]; Lee, J.[Lee, J.]; Yi, J.[Yi, J.]; Won, C.[Won, C.]
ArticleIssue Date2022CitationIEEE Access, v.10, pp.33829 - 33843PublisherInstitute of Electrical and Electronics Engineers Inc.