Han, Y.[Han, Y.]; Niyato, D.[Niyato, D.]; Leung, C.[Leung, C.]; Miao, C.[Miao, C.]; Kim, D.I.[Kim, D.I.]
ArticleIssue Date2022CitationIEEE International Conference on Communications, v.2022-May, pp.1196 - 1201PublisherInstitute of Electrical and Electronics Engineers Inc.