Nguyen H.H.[Nguyen H.H.]; Dang N.S.[Dang N.S.]; Van Duy N.[Van Duy N.]; Jang K.[Jang K.]; Baek K.[Baek K.]; Choi W.[Choi W.]; Raja J.[Raja J.]; Yi J.[Yi J.]
ArticleIssue Date2012CitationDiffusion and Defect Data Pt.B: Solid State Phenomena, v.181-182, pp.307 - 311