Shin, J.W.[Shin, J.W.]; Kim, J.S.[Kim, J.S.]; Chung, M.Y.[Chung, M.Y.]; Lee, S.J.[ Lee, S.J.]
ArticleIssue Date2017CitationProceedings - International Conference on Intelligent Systems, Modelling and Simulation, ISMS, pp.343 - 348PublisherIEEE Computer Society