Kwon Y.M.[Kwon Y.M.]; Oh S.-M.[Oh S.-M.]; Shin J.[Shin J.]; Chung M.Y.[Chung M.Y.]
ArticleIssue Date2016CitationIEEE Region 10 Annual International Conference, Proceedings/TENCON, v.2016-JanuaryPublisherInstitute of Electrical and Electronics Engineers Inc.