Kim M.-J.[Kim M.-J.]; Shin M.-H.[Shin M.-H.]; Choi S.-C.[Choi S.-C.]; Bae K.-C.[Bae K.-C.]; Won C.-Y.[Won C.-Y.]; Jung Y.-C.[Jung Y.-C.]
ArticleIssue Date2014CitationProceedings of the IEEE International Conference on Industrial Technology, pp.359 - 364