Ferroelectric properties of PZT/BFO multilayer thin films prepared using the sol-gel method
DC Field | Value | Language |
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dc.contributor.author | Jo, SH[Jo, Seo-Hyeon] | - |
dc.contributor.author | Lee, SG[Lee, Sung-Gap] | - |
dc.contributor.author | Lee, YH[Lee, Young-Hie] | - |
dc.date.accessioned | 2022-01-21T06:48:07Z | - |
dc.date.available | 2022-01-21T06:48:07Z | - |
dc.date.created | 2021-10-12 | - |
dc.date.issued | 2012-01-05 | - |
dc.identifier.issn | 1931-7573 | - |
dc.identifier.uri | https://scholarworks.bwise.kr/skku/handle/2021.sw.skku/94876 | - |
dc.description.abstract | In this study, Pb(Zr0.52Ti0.48)O-3/BiFeO3 [PZT/BFO] multilayer thin films were fabricated using the spin-coating method on a Pt(200 nm)/Ti(10 nm)/SiO2(100 nm)/p-Si(100) substrate alternately using BFO and PZT metal alkoxide solutions. The coating-and-heating procedure was repeated several times to form the multilayer thin films. All PZT/BFO multilayer thin films show a void-free, uniform grain structure without the presence of rosette structures. The relative dielectric constant and dielectric loss of the six-coated PZT/BFO [PZT/BFO-6] thin film were approximately 405 and 0.03%, respectively. As the number of coatings increased, the remanent polarization and coercive field increased. The values for the BFO-6 multilayer thin film were 41.3 C/cm(2) and 15.1 MV/cm, respectively. The leakage current density of the BFO-6 multilayer thin film at 5 V was 2.52 x 10(-7) A/cm(2). | - |
dc.language | 영어 | - |
dc.language.iso | en | - |
dc.publisher | SPRINGER | - |
dc.title | Ferroelectric properties of PZT/BFO multilayer thin films prepared using the sol-gel method | - |
dc.type | Article | - |
dc.contributor.affiliatedAuthor | Jo, SH[Jo, Seo-Hyeon] | - |
dc.identifier.doi | 10.1186/1556-276X-7-54 | - |
dc.identifier.scopusid | 2-s2.0-84862950056 | - |
dc.identifier.wosid | 000300255200001 | - |
dc.identifier.bibliographicCitation | NANOSCALE RESEARCH LETTERS, v.7, pp.1 - 5 | - |
dc.relation.isPartOf | NANOSCALE RESEARCH LETTERS | - |
dc.citation.title | NANOSCALE RESEARCH LETTERS | - |
dc.citation.volume | 7 | - |
dc.citation.startPage | 1 | - |
dc.citation.endPage | 5 | - |
dc.type.rims | ART | - |
dc.type.docType | Article | - |
dc.description.journalClass | 1 | - |
dc.description.journalRegisteredClass | scie | - |
dc.description.journalRegisteredClass | scopus | - |
dc.relation.journalResearchArea | Science & Technology - Other Topics | - |
dc.relation.journalResearchArea | Materials Sci | - |
dc.relation.journalWebOfScienceCategory | Nanoscience & Nanotechnology | - |
dc.relation.journalWebOfScienceCategory | Materials Science, M | - |
dc.subject.keywordAuthor | ZnO film | - |
dc.subject.keywordAuthor | growth angle | - |
dc.subject.keywordAuthor | antireflection coating | - |
dc.subject.keywordAuthor | RF | - |
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