ScholarWorks@SUNGKYUNKWAN UNIVERSITY: CHUN, JUNG HOON

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CHUN, JUNG HOON (전정훈)

Information and Communication Engineering (Semiconductor Systems Engineering)

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Clock and data recovery (CDR):5||Charged device model (CDM):3||light detection and ranging (LiDAR):3||3D imager:3||touch screen panel:3||DDI:3||Clocks:3||Digital quadricorrelator frequency detector (DQFD):3||CMOS depth sensor:3||SerDes:3||LCD driver IC:3||fast response current sensor:3||Jittertolerant frequency detector:3||LiDAR:2||DCO:2||Highspeed interface:2||Electrostatic discharge (ESD):2||Histogram:2||nonreturntozero (NRZ):2||onchip currentsensing circuit:2||DLL:2||CMOS image sensor:2||Memory interface:2||Tcoil:2||TCSPC:2||phaselocked loop (PLL):2||TOF:2||high uniformity:2||timetodigital converter (TDC):2||Charge pump:2||highspeed interface:2||Timing:2||5G Transceiver:2||impedance matching:2||Transceiver:2||pulse amplitude modulation (PAM4):2||CMOS integrated circuits:2||Chargerecycling:2||injectionlocked ring oscillator (ILRO):2||integrated circuit reliability:2||voltage 1:2||Modeling:2||CMOS:2||dualmode:2||Reliability:2||jitter:2||Ring oscillator:2||Multibit Decimator:2||SPAD:2||CMOS Image Sensor (CIS) System:2||Jitter:2||Driver circuits:2||feedforward equalizer (FFE):2||charge recycling:2||semiconductor diodes:2||Dualchannel:2||Shared CDR:2||Currentmode buck regulator:2||singlephoton avalanche diode (SPAD):2||Dynamic comparator:2||slew rate:2||CDR:2||Dynamic range:1||EEPROM:1||ESD:1||Encoding:1||Energy scavenging:1||Ensemble learning:1||Entanglement of identical particles:1||Equalizers:1||FFE:1||Fast Lock:1||Fast lock:1||Feedforward equalizer (FFE):1||Field failure detection:1||Fieldeffect diode (FED):1||FinFET:1||Fixed pattern noise:1||Flipped voltage follower:1||Frequency detector:1||Frequency modulation:1||Global shutter (GS):1||Groundreferenced signaling (GRS):1||Hadamard matrix:1||High uniformity:1||Highspeed integrated circuits:1||Highspeed link:1||Histogramming timetodigital converter (TDC):1||Histograms:1||IEEE:1||IQ demodulation:1||Image sensors:1||Indium tin oxide:1||Inductive link:1||Inductive peaking:1||Injectionlocked phaselocked loop (ILPLL):1||Integrated circuit interconnections:1||Integrated circuit modeling:1||Interconnections:1||Intersymbol interference:1||Jitter injection:1||LDO:1||LLI:1||LRMM:1||Laser radar:1||Latched comparator:1||Linearity:1||Local clamping:1||Local resistance variation:1||Low frequency mode:1||Low power:1||Lowdropout regulator:1||Lowtemperature polysilicon thinfilm transistors (LTPSTFTs):1||Maximum power point tracking:1||Merged Dual Delay Line:1||Merged dual delay line:1||Microcausality:1||Mirrors:1||Model of display cathode electrode:1||Modular microLED:1||Modulation:1||MultiDitherFree Phase Detector:1||Multibit decimator:1||Multiditherfree phase detector:1||Multigigahertz system:1||Multilevel BBPD:1||Nonvolatile memory:1||Nonlocality:1||OSPD:1||Offset calibration:1||Onchip jitter tolerance:1||Output capacitorless lowdropout regulator:1||PAM8:1||PFD controller:1||PLL:1||Phase interpolation:1||Phase measurement:1||Phaselockedloop:1||Photonics:1||Pins:1||Power demand:1||Python:1||QEC:1||RCtime constant:1||RF:1||RFID tag:1||Random access memory:1||Receivers:1||Referenceless CDR:1||Region Accumulator:1||Region accumulator:1||Reverse current block:1||Robot sensing systems:1||STTMRAM:1||Selfdiagnosis:1||Semiconductor manufacturing:1||Semiconductor reliability:1||Sensitivity:1||Serdes:1||Serial Link:1||Serial interface:1||Siliconcontrolled rectifier (SCR):1||SilicononInsulator (SOI):1||Simulator:1||Singleended (SE) signaling:1||Singlephoton avalanche diodes:1||Singleslope ADC:1||Slew rate:1||Stacked driver:1||Superselection rule:1||Switchedcapacitor:1||Switches:1||Symmetric and exterior algebra:1||Synchronization:1||TSP:1||Touch screen panel:1||Transceivers:1||Transient effect:1||Transmitter:1||USB:1||Visible light reflectance:1||Wide load current range:1||Wires:1||adaptive equalization:1||analog to digital converter:1||automotive:1||bandgap reference:1||barrelshifter DEM:1||bias current:1||capacitive fingerprint sensor:1||capacitive touch sensor:1||charge pump:1||chargerecycling technique:1||charged device model (CDM):1||clock and data recovery:1||clock and data recovery (CDR) circuit:1||clock and data recovery circuit:1||clock and data recovery circuits:1||clock embedded signaling:1||codesign methodology:1||columnparallel analogtodigital converter (ADC):1||comparators:1||comparators (circuits):1||complementary pass transistor logic:1||complementary switching:1||convolutional neural network:1||correlatedmultiplesampling (CMS):1||currentmode buck regulator:1||cycleslip detection:1||cycleslip detector:1||dcdc converter:1||deadzone compensation:1||deadzone compensation:1||decisionfeedback equalizer (DFE):1||deep learning:1||delta intensity:1||depth dynamic range (DDR):1||digitaltoanalog converter (DAC):1||digitally controlled oscillator (DCO):1||direct timeofflight (dTOF):1||display noise:1||dualloop clock and data recovery (CDR):1||dualloop phase locked loop:1||duobinary:1||dynamic voltage scaling:1||edge DFE:1||elec:1||electrostatic discharge (ESD):1||electrostatic discharges (ESDs):1||electrothermal:1||equalization:1||exclusiveOR circuit:1||external bias:1||feedforward inver:1||feedforward inverter:1||field effect diode:1||fieldeffect diode:1||fingerprint image enhancement:1||fingerprint recognition:1||finiteimpulse response (FIR):1||fixed depth noise (FDN):1||flexible display:1||frequency 1:1||frequency acquisition:1||frequency acquisition technique:1||frequency acquisition time:1||frequency to voltage converter:1||frequencytracking unit:1||fully differential charge amplifier:1||graphics doubledatarate (GDDR):1||halfrate linear PD:1||halfrate linear phase detector:1||halfrate linear phase detector (PD):1||high frequency buck regulator:1||high frequency jitter tolerance:1||highspeed I/O:1||highspeed logic:1||histogramming:1||indirect timeofflight (iToF):1||inductor:1||injection locked PLL (ILPLL):1||integrating receiver:1||integration time:1||interference (IF) canceling:1||interference (IF) filtering:1||internet of things:1||interpolation:1||intersymbol interference (ISI):1||jitter tolerance (JTOL):1||jitter tolerant frequency acquisition:1||latched comparator:1||level detection:1||level detector:1||level shifter:1||levelshifter:1||linearity:1||lo:1||load impedance contr:1||low latency int:1||low power:1||low power electronics:1||lowpower:1||lowpower electrically erasable programmable readonly memory:1||lowpower electronics:1||memory c:1||memory interface:1||mobile industry processor interface (MIPI) CPHY interface:1||motion artifact suppression:1||multilevel signaling:1||near ground:1||nearGND signaling:1||nearmemory computing:1||negative capacitance:1||offset calibration:1||oscillators:1||parameter extraction:1||parasitic light sensitivity (PLS):1||phase detectors:1||phaseinterpolator phaselocked loop (PIPLL):1||phaserotating PLL:1||phasetracking loop:1||photodiode (PD) on/off GS:1||pinned photodiode:1||power 17:1||power 26:1||power reduction techniques:1||precisely trimmed resistor:1||quantum dot (QD):1||quaternary search:1||readwrite circuit:1||receiver (RX):1||referenceless:1||referenceless CDR:1||referenceless clock and data recovery (CDR):1||referenceless singleloop CDR:1||referenceless singleloop clock:1||relaxation oscillator:1||relaxation oscillators:1||reliability:1||resistive selfbias:1||resistors:1||ring amplifier:1||ring oscillator:1||rolling shutter:1||scalable equations:1||scalable modeling:1||scanning LiDAR:1||selfbias circuit:1||selfbiased relaxation oscillator:1||selfcalibrated:1||selfcalibrated injection pulsewidth:1||selfcalibrated injection timing:1||selfdriving cars:1||silicononinsulator (SOI) technology:1||simultaneous driving:1||singleloop CDR:1||singlephoton avalanche diode:1||size 180:1||supply sensitivity:1||switched capacitor circuits:1||switchedbias technique:1||switchedcapacitor adder:1||tapweight control:1||temperature coefficient:1||temperature compensation:1||temperature sensitivity:1||temperature20:1||tetrapixel architecture:1||thermal modeling:1||thin display:1||thinfilm sensors:1||threedimensional (3D) integrated circuit:1||timeinterleaving:1||timeofflight (TOF) image sensor:1||timeofflight (ToF):1||timeofflight (ToF) sensor:1||timetodigital converter (TDC).:1||timing margin:1||touch controller:1||touch screen contoller:1||touch screen controller:1||touch sensor:1||transceiver:1||transmitter:1||transmitters:1||trident pinned photodiode (PPD):1||very fast transmission line pulses (VFTLP).:1||voltage domain (VD):1||voltage mode:1||voltage offset generation:1||voltage upconverter:1||voltagemode transmitter:1||wakeup timer:1||weighing matrix:1||wide frequency range:1||wide input dynamic range:1||wide temperature range:1||wireless sensor network:1||(EEPROM):1||수신기:1||0 V:1||0 degC:1||0 degC to 80:1||0 mW:1||0 nm:1||1UI extraction:1||2 MHz:1||3D silicononinsulator:1||3port impedance measurement:1||4:1 MUX:1||5 V:1||9 muW:1||ACcoupled equalization:1||ACcoupled equalization (EQ):1||ADCDSP:1||ADPLL:1||Acceleration test:1||Adaptive equalizer (EQ):1||Adaptive loop gain control (ALGC):1||Alldigital phaselocked loop (ADPLL):1||Allan deviation:1||Analog to digital converter:1||Asymmetric interface:1||BER modeling:1||BGR:1||BIST:1||BPM:1||Background light cancelling (BGLC):1||Balanced coding:1||Biphase modulation:1||Biterrorrate (BER):1||Black fine metal mesh:1||CIS:1||CML Driver:1||CMOS depth image sensor:1||CMOS image sensor (CIS):1||CMOS memory integrated circuits:1||CTLE:1||Capacitance:1||Capacitive touch:1||Capacitors:1||Cascoded drivers:1||Charge recycle:1||Charge recycling:1||Chip area:1||Class imbalance:1||Clock and Data Recovery:1||DCDC converter:1||DCC:1||DRAM chips:1||Deembedding:1||Dead zone:1||Deadzonecompensated frequency detector:1||Delay–locked loop:1||DelayLocked Loop:1||Delays:1||Device noise:1||Display noise:1||Doublepi equivalent circuit:1||Dual CDS:1||Dualmode:1||

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(03063) 25-2, SUNGKYUNKWAN-RO, JONGNO-GU, SEOUL, KOREAsamsunglib@skku.edu

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