ScholarWorks@SUNGKYUNKWAN UNIVERSITY: CHOI, JAE HYUK

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CHOI, JAE HYUK (최재혁)

Information and Communication Engineering (Semiconductor Systems Engineering)

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CMOS image sensor:4||3D imager:3||CMOS:3||SerDes:3||Clock and data recovery (CDR):3||CIS:3||Digital quadricorrelator frequency detector (DQFD):3||CMOS depth sensor:3||light detection and ranging (LiDAR):3||Jittertolerant frequency detector:3||singlephoton avalanche diode (SPAD):2||size 180:2||0 nm:2||columnparallel analogtodigital converter (ADC):2||Power demand:2||Deep learning:2||Deep learning hardware:2||Capacitors:2||SPAD:2||Device biometrics:2||LiDAR:2||Shared CDR:2||timeofflight (ToF):2||CMOS Image Sensor (CIS) System:2||timetodigital converter (TDC):2||Dualchannel:2||Chargerecycling:2||Emerging Memories:2||Stuckat Faults:2||FPN:2||pinned photodiode:2||5G Transceiver:2||TCSPC:2||FaultTolerance:2||TOF:2||Multibit Decimator:2||Training:2||Transceiver:2||Neural Networks:2||Clocks:2||Column FPN:2||Computer architecture:2||Histogram:2||CMOS image sensor (CIS):2||Inverters:1||Laser radar:1||Licenses:1||Linearity:1||Lymphoscintigraphy:1||MMP9:1||MRI:1||Malignant melanoma:1||Microprocessors:1||Mirrors:1||Modulation:1||Multibit decimator:1||Multilevel BBPD:1||Neural networks:1||Nonvolatile memory:1||Object detection:1||Oscillators:1||Overfitting:1||PET CT:1||Phase measurement:1||Photonics:1||Reliability:1||Residual neural networks:1||Resistance:1||Resource management:1||Robot sensing systems:1||Sebum:1||Sentinel lymph node:1||Singlephoton avalanche diodes:1||Singleslope ADC:1||Skin:1||Stacked driver:1||Standards:1||Switches:1||Systematics:1||TDC array:1||Task analysis:1||Threshold voltage:1||Timing:1||Transmitter:1||Ultraviolet protection:1||areaefficient TDC array:1||automotive:1||avalanche photodiodes:1||barrelshifter DEM:1||bias current:1||breast:1||breast cancer:1||capacitance DAC (CDAC):1||comparators:1||comparators (circuits):1||computer vision:1||correlated multiple sampling (CMS):1||correlatedmultiplesampling (CMS):1||deep neural networks:1||delta intensity:1||demodulation contrast:1||depth dynamic range (DDR):1||depth image:1||depth sensor:1||diagnosis:1||digitalanalogue conversion:1||digitaltoanalog converter (DAC):1||direct timeofflight (dTOF):1||distance 3:1||dropout:1||dualmode:1||duty cycling:1||epitaxial layer thickness:1||external bias:1||external singlephoton avalanche diode array:1||fixed depth noise (FDN):1||flexible display:1||frame difference:1||frequency 1:1||highresolution SPAD array:1||histogrambased TDC:1||histogrambased mixedsignal timetodigitalconverter array:1||histogramming:1||image classification:1||indirect timeofflight (iToF):1||integrated histogram generation unit:1||interference (IF) canceling:1||interference (IF) filtering:1||invalid TOF readings:1||lateral drift field:1||levelshifter:1||light pulse:1||lowpower:1||lowpower electronics:1||measured TOF:1||memory requirement:1||metastasis:1||mixed analoguedigital integrated circuits:1||mixedsignal TDC:1||modulation frequency:1||motion artifact suppression:1||negative capacitance:1||negative resistance.:1||neoadjuvant chemotherapy:1||neoplasm:1||object detection:1||optimization:1||overfitting:1||phasedependent latching:1||pinning voltage:1||power 17:1||power reduction techniques:1||precisely trimmed resistor:1||quaternary search:1||relaxation oscillator:1||relaxation oscillators:1||resistive selfbias:1||resistors:1||sampling methods:1||scanning LiDAR:1||scattered photons:1||secondary:1||selfbias circuit:1||selfbiased relaxation oscillator:1||selfdriving cars:1||singlephoton avalanche diode:1||spatial correlation:1||startup time:1||statistical analysis:1||statistical measurements:1||switchedbias technique:1||temperature coefficient:1||temperature20:1||temporal double sampling schemes:1||temporal noise.:1||tetrapixel architecture:1||threedimensional (3D):1||threshold voltage:1||timedigital conversion:1||timeofflight (TOF):1||timeofflight (TOF) image sensor:1||timeofflight (ToF) sensor:1||timeofflight depth sensors:1||timetodigital converter (TDC).:1||touch screen controller:1||touch screen panel:1||transfer gate:1||trident pinned photodiode (PPD):1||tumor response:1||ultralow power (ULP):1||voltage 1:1||wide temperature range:1||0 degC:1||word length 12 bit:1||0 degC to 80:1||0 m:1||2 MHz:1||5 V:1||9 muW:1||AP1:1||Analogdigital conversion:1||Autocorrelation:1||Background light cancelling (BGLC):1||Batch Normalization:1||Berberine:1||Biosensors:1||CMOS depth image sensor:1||CMOS digital integrated circuits:1||CMOS integrated circuits:1||CMOS process:1||Capacitance:1||Cell invasion:1||Checkerboard:1||Circuit faults:1||Circuits and systems:1||Computer vision:1||Convolution:1||Crystal oscillator:1||Deadzonecompensated frequency detector:1||Deep Neural Networks:1||Delays:1||Dual CDS:1||Dynamic range:1||Fault tolerance:1||Fault tolerant systems:1||FinFET:1||Fixed pattern noise:1||Frequency modulation:1||Gamma probe:1||HGU:1||Hardware:1||Histogramming timetodigital converter (TDC):1||Histograms:1||Hydration:1||IQ demodulation:1||Image classification:1||InternetofThings:1||

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(03063) 25-2, SUNGKYUNKWAN-RO, JONGNO-GU, SEOUL, KOREAsamsunglib@skku.edu

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