Park H.[Park H.]; Lee Y.-J.[Lee Y.-J.]; Park J.[Park J.]; Kim Y.[Kim Y.]; Yi J.[Yi J.]; Lee Y.[Lee Y.]; Kim S.[Kim S.]; Park C.-K.[Park C.-K.]; Lim K.-J.[Lim K.-J.]
ArticleIssue Date2018CitationTransactions on Electrical and Electronic Materials, v.19, no.3, pp.165 - 172PublisherKorean Institute of Electrical and Electronic Material Engineers