Le, A.H.T.[Le, A.H.T.]; Kim, Y.[Kim, Y.]; Lee, Y.-J.[Lee, Y.-J.]; Hussain, S.Q.[Hussain, S.Q.]; Nguyen, C.P.T.[Nguyen, C.P.T.]; Lee, J.[Lee, J.]; Yi, J.[Yi, J.]
ArticleIssue Date2018CitationAPPLIED SURFACE SCIENCE, v.433, pp.798 - 805PublisherELSEVIER SCIENCE BV