Lee, J.[Lee, J.]; Kokkiligadda, S.[Kokkiligadda, S.]; Mariyappan, K.[Mariyappan, K.]; Jo, S.[Jo, S.]; Park, S.[Park, S.]; Tandon, A.[Tandon, A.]; Jeon, S.[Jeon, S.]; Jeon, J.-H.[Jeon, J.-H.]; Park, S.H.[Park, S.H.]
ArticleIssue Date2022CitationCurrent Applied Physics, v.37, pp.39 - 44PublisherElsevier B.V.