Lee, H.[Lee, H.]; Lee, W.[Lee, W.]; Kim, T.[Kim, T.]; Helaoui, M.[Helaoui, M.]; Ghannouchi, F.M.[Ghannouchi, F.M.]; Yang, Y.[Yang, Y.]
ArticleIssue Date2019CitationIEEE Access, v.7, pp.66275 - 66280PublisherInstitute of Electrical and Electronics Engineers Inc.