Lee, D.[Lee, D.]; Sun, Y.G.[Sun, Y.G.]; Sim, I.[Sim, I.]; Kim, J.[Kim, J.]; Shin, Y.[Shin, Y.]; Kim, D.I.[Kim, D.I.]; Kim, J.Y.[Kim, J.Y.]
ArticleIssue Date2021CitationIEEE Access, v.9, pp.159175 - 159186PublisherInstitute of Electrical and Electronics Engineers Inc.