Lim, J.[Lim, J.]; Kim, J.[Kim, J.]; Yan, L.[Yan, L.]; Noh, H.[Noh, H.]; Jung, S.[Jung, S.]; Seol, D.[Seol, D.]; Pyo, J.[Pyo, J.]; Jung, T.[Jung, T.]; Yun, J.[Yun, J.]; Park, D.[Park, D.], et al.
ArticleIssue Date2021CitationIS and T International Symposium on Electronic Imaging Science and Technology, v.2021, no.7PublisherSociety for Imaging Science and Technology