Al-Rakhami, Mabrook S.; Gumaei, Abdu; Altaf, Meteb; Hassan, Mohammad Mehedi; Alkhamees, Bader Fahad; Muhammad, Khan; Fortino, Giancarlo
ArticleIssue Date2021CitationIEEE ACCESS, v.9, pp 94299 - 94308PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC